Journal article
A. Prasad, Sourajeet Roy
2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015
2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015
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DOI
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APA
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Prasad, A., & Roy, S. (2015). Global sensitivity based dimension reduction for fast variability analysis of nonlinear circuits. 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS).
Chicago/Turabian
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Prasad, A., and Sourajeet Roy. “Global Sensitivity Based Dimension Reduction for Fast Variability Analysis of Nonlinear Circuits.” 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS) (2015).
MLA
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Prasad, A., and Sourajeet Roy. “Global Sensitivity Based Dimension Reduction for Fast Variability Analysis of Nonlinear Circuits.” 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015.
BibTeX Click to copy
@article{a2015a,
title = {Global sensitivity based dimension reduction for fast variability analysis of nonlinear circuits},
year = {2015},
journal = {2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)},
author = {Prasad, A. and Roy, Sourajeet}
}